hwmon: (occ) Fix potential integer overflow
Cast get_unaligned_be32(...) to u64 in order to give the compiler complete information about the proper arithmetic to use and avoid a potential integer overflow. Notice that such function call is used in contexts that expect expressions of type u64 (64 bits, unsigned); and the following expressions are currently being evaluated using 32-bit arithmetic: val = get_unaligned_be32(&power->update_tag) * occ->powr_sample_time_us; val = get_unaligned_be32(&power->vdn.update_tag) * occ->powr_sample_time_us; Addresses-Coverity-ID: 1442357 ("Unintentional integer overflow") Addresses-Coverity-ID: 1442476 ("Unintentional integer overflow") Addresses-Coverity-ID: 1442508 ("Unintentional integer overflow") Fixes: ff692d80b2e2 ("hwmon (occ): Add sensor types and versions") Cc: stable@vger.kernel.org Signed-off-by: Gustavo A. R. Silva <gustavo@embeddedor.com> Reviewed-by: Eddie James <eajames@linux.ibm.com> Signed-off-by: Guenter Roeck <linux@roeck-us.net>
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@ -380,8 +380,8 @@ static ssize_t occ_show_power_1(struct device *dev,
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val *= 1000000ULL;
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break;
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case 2:
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val = get_unaligned_be32(&power->update_tag) *
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occ->powr_sample_time_us;
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val = (u64)get_unaligned_be32(&power->update_tag) *
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occ->powr_sample_time_us;
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break;
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case 3:
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val = get_unaligned_be16(&power->value) * 1000000ULL;
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@ -425,8 +425,8 @@ static ssize_t occ_show_power_2(struct device *dev,
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&power->update_tag);
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break;
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case 2:
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val = get_unaligned_be32(&power->update_tag) *
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occ->powr_sample_time_us;
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val = (u64)get_unaligned_be32(&power->update_tag) *
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occ->powr_sample_time_us;
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break;
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case 3:
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val = get_unaligned_be16(&power->value) * 1000000ULL;
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@ -463,8 +463,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
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&power->system.update_tag);
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break;
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case 2:
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val = get_unaligned_be32(&power->system.update_tag) *
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occ->powr_sample_time_us;
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val = (u64)get_unaligned_be32(&power->system.update_tag) *
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occ->powr_sample_time_us;
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break;
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case 3:
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val = get_unaligned_be16(&power->system.value) * 1000000ULL;
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@ -477,8 +477,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
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&power->proc.update_tag);
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break;
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case 6:
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val = get_unaligned_be32(&power->proc.update_tag) *
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occ->powr_sample_time_us;
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val = (u64)get_unaligned_be32(&power->proc.update_tag) *
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occ->powr_sample_time_us;
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break;
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case 7:
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val = get_unaligned_be16(&power->proc.value) * 1000000ULL;
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@ -491,8 +491,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
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&power->vdd.update_tag);
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break;
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case 10:
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val = get_unaligned_be32(&power->vdd.update_tag) *
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occ->powr_sample_time_us;
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val = (u64)get_unaligned_be32(&power->vdd.update_tag) *
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occ->powr_sample_time_us;
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break;
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case 11:
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val = get_unaligned_be16(&power->vdd.value) * 1000000ULL;
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@ -505,8 +505,8 @@ static ssize_t occ_show_power_a0(struct device *dev,
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&power->vdn.update_tag);
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break;
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case 14:
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val = get_unaligned_be32(&power->vdn.update_tag) *
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occ->powr_sample_time_us;
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val = (u64)get_unaligned_be32(&power->vdn.update_tag) *
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occ->powr_sample_time_us;
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break;
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case 15:
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val = get_unaligned_be16(&power->vdn.value) * 1000000ULL;
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