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This patch just replace the string 'selftest' with 'unittest'
in OF unittest and data and binding file.
I have tested it successfully on ARM.
Signed-off-by: Wang Long <long.wanglong@huawei.com>
Signed-off-by: Rob Herring <robh@kernel.org>
Introduce I2C device tree overlay tests.
Tests insertion and removal of i2c adapters, i2c devices, and muxes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Rob Herring <robh@kernel.org>
Introduce selftests for overlays using sub-devices present
in children nodes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Add unittests for OF overlays.
It tests overlay device addition/removal and whether
the apply revert sequence is correct.
Changes since V1:
* Added local fixups entries.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
