IF YOU WOULD LIKE TO GET AN ACCOUNT, please write an
email to Administrator. User accounts are meant only to access repo
and report issues and/or generate pull requests.
This is a purpose-specific Git hosting for
BaseALT
projects. Thank you for your understanding!
Только зарегистрированные пользователи имеют доступ к сервису!
Для получения аккаунта, обратитесь к администратору.
Add support for configfs interface so that f_printer can be used as a
component of usb gadgets composed with it.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UVC function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UAC2 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UAC1 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SOURCESINK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SERIAL function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test RNDIS function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test PHONET function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test OBEX function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test NCM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MIDI function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MASS STORAGE function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test LOOPBACK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test HID function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test FFS (FunctionFS) function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test EEM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM subset function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
The newly added file will be used to provide descriptions of how to test
the functions of USB gadgets.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
