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[PATCH] fix test regressions
On Sat, Apr 17, 2004 at 03:30:29AM +0200, Kay Sievers wrote: > On Sat, Apr 17, 2004 at 02:04:55AM +0200, Kay Sievers wrote: > > On Fri, Apr 16, 2004 at 04:04:42PM -0700, Greg KH wrote: > > > Oh, and if you run the latest udev_test.pl, we have a bunch more tests, > > > including a few that fail, if you were looking for something to do :) > > > > Will do it. We need to change apply_format(). I tries to expand the '%%' > > with the next iteration over the string and removes the '%'. The tests are all successful now. If this patch breaks something else, we simply have too few tests :)
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parent
3a0b657b76
commit
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13
namedev.c
13
namedev.c
@ -199,23 +199,21 @@ static void apply_format(struct udevice *udev, char *string, size_t maxsize,
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struct sysfs_attribute *tmpattr;
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pos = string;
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while (1) {
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pos = strchr(string, '%');
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if (pos != NULL) {
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pos = strchr(pos, '%');
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if (pos == NULL)
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break;
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pos[0] = '\0';
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tail = pos+1;
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len = get_format_len(&tail);
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c = tail[0];
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strfieldcpy(temp, tail+1);
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tail = temp;
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} else {
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break;
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}
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dbg("format=%c, string='%s', tail='%s'",c , string, tail);
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attr = get_format_attribute(&tail);
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switch (c) {
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case 'b':
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if (strlen(udev->bus_id) == 0)
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@ -286,6 +284,7 @@ static void apply_format(struct udevice *udev, char *string, size_t maxsize,
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break;
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case '%':
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strfieldcatmax(string, "%", maxsize);
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pos++;
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break;
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default:
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dbg("unknown substitution type '%%%c'", c);
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