IF YOU WOULD LIKE TO GET AN ACCOUNT, please write an
email to Administrator. User accounts are meant only to access repo
and report issues and/or generate pull requests.
This is a purpose-specific Git hosting for
BaseALT
projects. Thank you for your understanding!
Только зарегистрированные пользователи имеют доступ к сервису!
Для получения аккаунта, обратитесь к администратору.
Compilation may configure it's own /etc path so ensure the test
has a defined location for access to this dir during testing.
Also prepare machine_id filei (with the use of uuidgen tool)
for the test.
The command "lvcreate --type thin --snapshot ..." to create a thin
snapshot would fail.
commit d651b340e6 removed the optional
"--type thin" from the command definition "lvcreate --snapshot LV_thin",
and added --type thin as AUTOTYPE. This was correct and should not have
changed anything if all the command defs were correct, but it broke
the "lvcreate --type thin --snapshot" case. It reveals a problem in a
different command definintion: "lvcreate --type thin LV_thin" that was
missing --snapshot in its OO list.
Fix in the code that matches devices to system.devices entries when
the devices have the same serial number. A non-PV device in
system.devices has no pvid value, and the code was segfaulting
when checking the null pvid value.
In previous lvm versions, trailing spaces at the end of a t10 wwid would
be replaced with underscores, so the IDNAME string in system.devices
would look something like "t10.123_". Current versions of lvm ignore
trailing spaces in a t10 wwid, so the IDNAME string used would be
"t10.123". The different values would cause lvm to not recognize a
device in system.devices with the trailing _. Fix this by ignoring
trailing underscores in the IDNAME string from system.devices.
The recent fix 05c2b10c5d ensures that raid LV images are not
using the same devices. This was happening in the lvextend commands
used by this test, so fix the test to use more devices to ensue
redundancy.
Check for running (possibly leftover) lvmdbusd running in the
system - as this daemon may interfere with this test as in this
case both be operating on same 'live' data in /run/lvm.
Make test faster by agregating sets of operation to work on a single
created filesystem yet checking all the variants of extension and reduction.
Split 'xfs' part into separate test and convert it for use of the
minimal size 300M nowdays required by mkfs.xfs.
Previous commit cause the pvmove could actually be started in unexpected
order - so make sure, we are not starting new pvmove in same VG until
the previous one is started.
Keep backups within test_dir instead of dev_dir (so it doesn't
leak large files there if the tests are run over real /dev dir).
Move restoring of dm_mirror throttling before test_dir is removed.
Not quite sure if this helps anything, some of testing
machines can't reliably remove scsi_debug, reporting
they are in use - but it's not easily reproducible...
aux wait_pvmove_lv_ready() now handles multiple pvmove LVs
at one go - which allows a bit fast checking - although
at some point we may need to switch to use delayed devs
since mirror throttling seems to be no longer working well,
as CPU are getting so fast, that most of data are already
pvmoved before throttling has any chance to do something...
When 'brd' device can be removed (is unused AKA not opened),
remove such device and use again for testing.
Let's assume user has no unused brd device left in the system.
When the 'tests' sometimes fail to cleanup devices, with this
change futher cleanup from some next test may evenually release
brd device and make it available for testing.
Convert test to use only ext4 instead of 300M demanding XFS.
Shorten 'B' files to 4K and use 4K strip size with >raid1 arrays
so we do not risk spreading of the file across stripe.
Also use easier 'aux corrupt_dev()' method to introduce a bit
corruption into a block device with integrity.
TODO: shorten _wait_recalc (should't be needed).
Add function to corrupt some bytes in give file path presenting
a device. 1st. patern in just once replaced with 2nd. pattern.
Usable to simulate some bit corruption for integrity devices.
